The Department of Materials Science and Metallurgical Engineering at IIT Hyderabad is organizing a six-day workshop on “Advanced Materials Characterization Techniques” during 27th Aug-1st Sept 2019 supported by TEQIP (MHRD). Participants from colleges, R&D organizations, and industries are invited to attend this workshop.
Materials properties are directly related to the internal details of the materials. Materials characterization provides an understanding of the internal details of a material at different length scales, which is the backbone of the Materials Science and Engineering field.
There exist several characterization techniques and this workshop shall delve on teaching the common techniques with its advanced usages. In this workshop, basics and advanced usages of electron microscopy (scanning electron microscopy, transmission electron microscopy), X-ray diffraction, Scanning probe microscopy, and Raman spectroscopy shall be taught.
Moreover, afternoon sessions shall be on hands-on practical on these techniques. Different experts of these materials characterization techniques shall be taking the lectures.
During the workshop following would be taught to the participants
• Basics of Electron Microscopy (imaging, diffraction, phase contrast, analytical) and Advanced Electron Microscopy (STEM, EDS, EELS, In-situ TEM) • Basics of X-ray Diffraction and its advanced usages
• Basics of Scanning Probe Microscopy
• Basics of Magnetic Characterization
• Basics of Raman Spectroscopy and its advanced usages
All through the lectures, talks will be well supported with several examples and case studies. In afternoon sessions, a suitable small project using electron microscopes, X-ray diffraction, FMR and Raman spectroscopy will be performed.
To register online, click here.
The last date to register is Aug 17, 2019.
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